Field Emission Scanning Electron Microscope (FESEM)

FESEM is the imaging tool for nanoparticles, featuring 1nm resolution at 15 kV. This equipment allows operating in two vacuum modes (high vacuum and low vacuum), to inspect conducting and insulating samples.

Secondary electron (SE) imaging can be undertaken in both field-free and immersion mode (TLD) for comprehensive low-to-high resolution imaging of a variety of samples and can achieve over 100,000x magnification.

This equipment is located in the Characterisation Laboratory, which has obtained the MS ISO/IEC 17025 Quality System Certification for the test method 'Morphology Imaging of Solid Materials Using FESEM.' For detailed information, please refer to the provided link.

For further inquiries, please contact our officer at ion2_services@upm.edu.my 

 

Brand: FEI

Model: NOVA NANOSEM 230

 

 

Updated:: 01/06/2023