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Field Emission Scanning Electron Microscope (FESEM)
FESEM is an imaging tool for nanoparticles, featuring a 1nm resolution at 15 kV. This equipment allows operation in two vacuum modes (high vacuum and low vacuum) to inspect conducting and insulating samples.
Secondary electron (SE) imaging can be undertaken in both field-free and immersion mode (TLD) for comprehensive low-to-high resolution imaging of a variety of samples, achieving over 100,000x magnification.
This equipment is located in the Characterisation Laboratory, which has obtained the MS ISO/IEC 17025 Quality System Certification for the test method 'Morphology Imaging of Solid Materials Using FESEM.' For detailed information, please refer to the provided link.
Fee range: RM400 - RM650 per hour.
**Subject to terms and conditions. For further inquiries, please get in touch with our officer at ion2_services@upm.edu.my