X-ray Diffractometer (XRD) | INSTITUTE OF NANOSCIENCE AND NANOTECHNOLOGY (ION2)
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X-ray Diffractometer (XRD)

X-ray Diffractometer (XRD) is a rapid analytical technique primarily used for the identification of a crystalline phase of various materials such as powder, thin-film, bulky samples, and quantitative phase analysis.

XRD can also obtain the phase structure of materials of the atomic and molecular levels present in the sample.

Application of qualitative and quantitative analysis by XRD:

1. Phase identification
2. Quantitative analysis
3. Crystal structure distribution
4. Small-angle x-ray scattering (SAXS)
5. X-ray reflectometry (XRR)
6. Residual stress
7. High-resolution XRD (HRXRD)

 

For further inquiries, please contact our officer at ion2_services@upm.edu.my

 

Brand: Rigaku

Model: SmartLab (2), MiniFlex 600

 

Updated:: 13/10/2022 [nurnazeera]

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